Atomic Force Microscopy (AFM)
Responsibility:
NX20 from Park Systems
- Premounted cantilevers → external page easy tip exchange
- Motorized x-y stage
- On-axis CCD camera
- Maximum sample size: 6 inch in diameter and 20 mm in height
- Vacuum sample chuck or magnetic sample mounting
- Smartscan software with external page auto mode
Topography modes (standard modes):
- Non-contact mode
- Tapping mode
- Contact mode
- Lateral Force Microscopy
- Phase imaging mode
Advanced modes (on special request):
- Electrostatic Force Microscopy (EMF)
- Nanomechanical mode
- Enhanced Electrostatic Force Microscopy
- Nanoindentation
- Magnetic Force Microscopy
Self-teaching:
- external page AFM Basic Training
- external page Non-contact mode
- external page Tapping mode
- external page Contact mode
- external page Lateral Force Microscopy (LMF)
- external page Electrostatic Force Microscopy (EFM)
- external page Force Distance Spectroscopy
- external page Nanoindentation
- external page Magnetic Force Microscopy (MFM)