Research Equipment
Characterization
- Optical microscopy
- Scanning Electron Microscopy (SEM)
- Atomic Force Microscopy (AFM)
- Surface Profiling
- Spectroscopic Ellipsometry (SE)
- Optical Reflectometry
- Photoluminescence Mapping
- X-ray Diffraction
- Electrochemical Capacitance-Voltage Profiling (CV)
- Hall-Effect Measurement
- Electrical Testing (Wafer Probing)
- Stress Measurement