Atomic Force Microscopy (AFM)

NX20 from Park Systems

• Premounted cantilevers → external page easy tip exchange
  
• Motorized x-y stage
• On-axis CCD camera
  
• Maximum sample size: 6 inch in diameter and 20 mm in height
  
• Vacuum sample chuck or magnetic sample mounting
• Smartscan software with external page auto mode
  

Topography modes (standard modes):

• Non-contact mode
• Tapping mode
• Contact mode
• Lateral Force Microscopy
• Phase imaging mode

Advanced modes (on special request):

• Electrostatic Force Microscopy (EMF)
  
• Nanomechanical mode
  
• Enhanced Electrostatic Force Microscopy
  
• Nanoindentation
• Magnetic Force Microscopy